Quantification of Fluorescence (confocal microscope)

References

Brakenhoff, G.J.; Wurpel, G. W.; Jalink, K.; Oomen, L.; Brocks, L.; Zwier, J.M.

Characterization of sectioning fluorescence microscopy with thin uniform fluorescent layers: Sectioned Imaging Property or SIPcharts

J Microsc. 219, 122-132 (2005)

Zwier, J. M.; Oomen, L.; Brocks, L.; Jalink, K.; Brakenhoff, G. J.

Quantitative image correction and calibration for confocal fluorescence microscopy using thin reference layers and SIPchart-based calibration procedures

J. Microsc. 231, 59-69 (2008)