Scanning Parameters
High resolution scans for deconvolution
- Choose appropriate voxel sizes (sampling distances) in X/Y and Z direction (scan more slices and less accumulation per slice, if possible (in most cases, accumulation=2 is enough)
- set accurate offset (low background, but no green pixels) and PMT setting (almost no blue pixels). Otherwise the correction by deconvolution may not be correct
- In case of an offset set too high, negative noise may be filtered out and calculation may be wrong caused by incorrect distribution of gray values
- Scan: include all visible structures plus non-sharp slices plus several additional seemingly signal-free slices, because they may contain low signals needed for correct deconvolution
Determining the ideal sampling intervals for high resolution 3D imaging
- use the Nyquist rate and PSF Calculator from SVI
- "For Confocal Microscope images sampling distances may be up to 1.7 times the Nyquist ones. When large pinholes are used, up to 2 times larger" (cited from the SVI WIKI page on Nyquist rate and PSF calculator
Another calculator
The Java applet is taken from http://www.pasteur.fr/recherche/unites/Pfid.
BITPLANE sampling calculator (from BITPLANE, Switzerland)
- Sampling interval (voxel size) table (calculated values a bit less restrictive)
| Emission Wavelength (nm) |
Numerical Aperture of the
lens |
refractive index of the medium |
Voxelsize x,y (nm) |
Voxelsize z (nm) |
|---|---|---|---|---|
514 |
1.0 |
1.40 |
128 |
305 |
514 |
1.2 |
1.33 |
107 |
170 |
514 |
1.3 |
1.40 |
98 |
145 |
514 |
1.4 |
1.40 |
91 |
91 |
580 |
1.0 |
1.40 |
145 |
345 |
580 |
1.2 |
1.33 |
121 |
192 |
580 |
1.3 |
1.40 |
111 |
164 |
580 |
1.4 |
1.40 |
103 |
103 |